Infrared Pulse and Lock-In techniques are in use for NDT applications worldwide for Defect
Imaging, Stress Imaging, Solar-Cell Shunt Imaging, Solar-Cell Carrier-Density/Lifetime Imaging, and
Semiconductor Photo-and Electro-Luminescence imaging. A variety of active-sources, various infrared
camera types and a selection of analytical tools are available for monitoring the responses of the
materials to the active-sources. This chapter presents an overview of this rich choice of NDT tools used
in academia, laboratories and factories for studies of material types ranging from composites, metals,
ceramics, polymers and concrete, to semiconductors, solar cells, bones, leather and cheese, and projects
strong future growth for the technology.
Keywords: NDT, infrared, thermography, lock-in, transient, flash, stress, delamination, cracks, shunts,
photoluminescence, electroluminescence, LIT, vibrothermography, defects.
