The development of Technology in the field of electronic devices is going
very rapidly. Factors such as cost, performance, complexity, and portability are
contemplated over and over again. Nowadays low cost and better performance
captivate the interest of a wide range of public. To meet these demands of the public
various components are integrated onto a single chip. As this integration increases, the
complexity of the devices increases which leads to increased chances of faults and
failures in a device. It is not that today’s urban human is using the electronics keeping
hi-tech gadgets in hand, but today’s mechanical transport means are also driven by
daily changing and improved electronics devices. So many times, there are recalls of
sold components or devices by leading electronics giants due to post prediction of their
failure. This happens because the companies are using traditional techniques for
condition monitoring and reliability testing. Even big automobile giants have to recall
their cars for defects occurring in the later stage. One of the examples of recalling of
TATA public transport buses sold to DTC in Delhi, India, as those automobiles are
getting caught in the fire in many cases. Traditionally, to analyze electronic
components reliability and condition monitoring, three techniques are used, viz., using
empirical methods including standard handbooks MILHDBK-217, BELLCORE, and
PRISM; analyzing using life testing experiments; collect maintenance and operating
data and perform statistical analysis.
Keywords: Failure Prediction, Failure Rate, Faults, Reliability.